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CMOS fixed pattern noise elimination based on sparse unidirectional hybrid total variation
Zhang T(张涛)1,2,3; Li, Xinyang1; Li, Jianfeng2; Xu Z(徐稚)3
发表期刊Sensors
2020-10-01
卷号20期号:19页码:1-20
DOI10.3390/s20195567
产权排序第3完成单位
收录类别SCI ; EI
关键词FPN sparse total variation anisotropy characteristic
摘要

With the improvement of semiconductor technology, the performance of CMOS Image Sensor has been greatly improved, reaching the same level as that of CCD in dark current, linearity and readout noise. However, due to the production process, CMOS has higher fix pattern noise than CCD at present. Therefore, the removal of CMOS fixed pattern noise has become the research content of many scholars. For current fixed pattern noise (FPN) removal methods, the most effective one is based on optimization. Therefore, the optimization method has become the focus of many scholars. However, most optimization models only consider the image itself, and rarely consider the structural characteristics of FPN. The proposed sparse unidirectional hybrid total variation (SUTV) algorithm takes into account both the sparse structure of column fix pattern noise (CFPN) and the random properties of pixel fix pattern noise (PFPN), and uses adaptive adjustment strategies for some parameters. From the experimental values of PSNR and SSM as well as the rate of change, the SUTV model meets the design expectations with effective noise reduction and robustness.

资助项目National Natural Science Foundation of China[11573066] ; National Natural Science Foundation of China[11873091] ; Yunnan Province Basic Research Plan[2019FA001]
项目资助者National Natural Science Foundation of China[11573066, 11873091] ; Yunnan Province Basic Research Plan[2019FA001]
语种英语
学科领域电子、通信与自动控制技术
文章类型Article
出版者MDPI
出版地ST ALBAN-ANLAGE 66, CH-4052 BASEL, SWITZERLAND
ISSN1424-8220
URL查看原文
WOS记录号WOS:000586668100001
WOS研究方向Chemistry ; Engineering ; Instruments & Instrumentation
WOS类目Chemistry, Analytical ; Engineering, Electrical & Electronic ; Instruments & Instrumentation
关键词[WOS]NONUNIFORMITY CORRECTION ; REMOVAL ; IMAGERY
EI入藏号20204109323676
EI主题词CMOS integrated circuits
EI分类号714.2 Semiconductor Devices and Integrated Circuits - 751.4 Acoustic Noise
引用统计
被引频次:8[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ynao.ac.cn/handle/114a53/23687
专题天文技术实验室
抚仙湖太阳观测和研究基地
通讯作者Li, Xinyang
作者单位1.Key Laboratory of Adaptive Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, 610209, China
2.School of Optoelectronic Information, University of Electronic Science and Technology, Chengdu, 611731, China
3.Astronomical Technology Laboratory, Yunnan Observatory, Chinese Academy of Sciences, Kunming, 650216, China
第一作者单位中国科学院云南天文台
推荐引用方式
GB/T 7714
Zhang T,Li, Xinyang,Li, Jianfeng,et al. CMOS fixed pattern noise elimination based on sparse unidirectional hybrid total variation[J]. Sensors,2020,20(19):1-20.
APA Zhang T,Li, Xinyang,Li, Jianfeng,&Xu Z.(2020).CMOS fixed pattern noise elimination based on sparse unidirectional hybrid total variation.Sensors,20(19),1-20.
MLA Zhang T,et al."CMOS fixed pattern noise elimination based on sparse unidirectional hybrid total variation".Sensors 20.19(2020):1-20.
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